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dc.rights.licenseCC-BY-NC-ND
dc.contributor.advisorDrury, M.
dc.contributor.advisorHamers, M.
dc.contributor.authorJansen, R.J.
dc.date.accessioned2020-11-23T19:00:10Z
dc.date.available2020-11-23T19:00:10Z
dc.date.issued2019
dc.identifier.urihttps://studenttheses.uu.nl/handle/20.500.12932/38141
dc.description.abstractThe field of paleopiezometry has long been an important tool in the determination of paleo stresses. In order to make an as accurately as possible stress estimate, it is necessary that the microstructures used for paleopiezometry are measured as accurately as possible. This thesis aims to determine if cathodoluminescence (CL) imaging is a viable alternative or addition to light microscopy and/or electron backscatter diffraction (EBSD), with regards to subgrain detection and measurement. To achieve this aim, four different detection methods are each applied to four samples. These four methods are light microscopy, scanning electron microscopy with CL detector (SEM-CL), electron microprobe mapping and EBSD mapping. Three of the studied samples are naturally deformed and one experimentally. To determine the accuracy of the subgrain detection methods, stress estimates are made using paleopiezometry. These stress estimates are then compared to stress estimates made from recrystallized grain paleopiezometry of the same samples. The observations and data that results from this thesis indicates that while CL is a useful and fast method for detecting subgrains, it cannot be used without a second method to distinguish between subgrain boundaries and other microstructures i.e. Dauphiné twins.
dc.description.sponsorshipUtrecht University
dc.format.extent15585134
dc.format.mimetypeapplication/pdf
dc.language.isoen
dc.titleThe viability of CL subgrain imaging for determining paleostresses in quartz
dc.type.contentMaster Thesis
dc.rights.accessrightsOpen Access
dc.subject.keywordsCl-imaging, Subgrain boundaries, Quartz, SEM-CL, Electron microprobe, EBSD, Paleopiezometry
dc.subject.courseuuEarth Structure and Dynamics


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