Show simple item record

Signatures of temporary charge carrier trapping by single quantum dot spectroscopy and spectroelectrochemistry

dc.rights.licenseCC-BY-NC-ND
dc.contributor.advisorRabouw, F.T.
dc.contributor.authorVonk, S.J.W.
dc.date.accessioned2019-08-22T17:00:25Z
dc.date.available2019-08-22T17:00:25Z
dc.date.issued2019
dc.identifier.urihttps://studenttheses.uu.nl/handle/20.500.12932/33520
dc.description.sponsorshipUtrecht University
dc.format.extent13205176
dc.format.mimetypeapplication/pdf
dc.language.isoen
dc.titleSignatures of temporary charge carrier trapping by single quantum dot spectroscopy and spectroelectrochemistry
dc.type.contentHonours Program Thesis
dc.rights.accessrightsOpen Access
dc.subject.courseuuNanomaterials Science


Files in this item

Thumbnail
Name:
SJWVonk_masterthesisSCM_finalv ...
Size:
12.59Mb
Format:
PDF
View/Open

This item appears in the following Collection(s)

Show simple item record