Signatures of temporary charge carrier trapping by single quantum dot spectroscopy and spectroelectrochemistry
dc.rights.license | CC-BY-NC-ND | |
dc.contributor.advisor | Rabouw, F.T. | |
dc.contributor.author | Vonk, S.J.W. | |
dc.date.accessioned | 2019-08-22T17:00:25Z | |
dc.date.available | 2019-08-22T17:00:25Z | |
dc.date.issued | 2019 | |
dc.identifier.uri | https://studenttheses.uu.nl/handle/20.500.12932/33520 | |
dc.description.sponsorship | Utrecht University | |
dc.format.extent | 13205176 | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | |
dc.title | Signatures of temporary charge carrier trapping by single quantum dot spectroscopy and spectroelectrochemistry | |
dc.type.content | Honours Program Thesis | |
dc.rights.accessrights | Open Access | |
dc.subject.courseuu | Nanomaterials Science |