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dc.rights.licenseCC-BY-NC-ND
dc.contributor.advisorOosten, D. van
dc.contributor.advisorKhosropanah, P.
dc.contributor.authorHeijden, N.J. van der
dc.date.accessioned2013-10-16T17:03:09Z
dc.date.available2013-10-16
dc.date.available2013-10-16T17:03:09Z
dc.date.issued2013
dc.identifier.urihttps://studenttheses.uu.nl/handle/20.500.12932/15144
dc.description.abstractControlling the superconducting critical temperature (TC)of Ti/Au bilayers is vital in the development of TES detectors. Previously empirical studies have been done on aging effects in Ti/Au and other superconducting bilayers but no link with theory has been made, nor is there a clear explanation for the observed degradation in TC. Here we attempt to explain the change in TC with a diffusion mechanism. The change in TC has been measured for a set of Ti/Au bilayer samples that have been given a variety of heat treatments, where we found a trend that can be partly explained by an inter-diffusion mechanism. With a theoretical model based on diffusion a safe zone can be defined as a region of bake-out treatments, where the TC is unchanged or not affected beyond the requirements of a practical TES detector. This will shine light on the bake-out and storage condition boundaries of these detectors.
dc.description.sponsorshipUtrecht University
dc.format.extent36761265 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen
dc.titleDiffusion Behaviour in Superconducting Ti/Au Bilayers for Transition Edge Sensors to be Applied in Satellite Detectors
dc.type.contentMaster Thesis
dc.rights.accessrightsOpen Access
dc.subject.keywordsaging,Ti/Au bilayer,transition edhe sensor,TES,diffusion
dc.subject.courseuuNanomaterials: Chemistry and Physics


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